The demand for data traffic in systems such as 5G communication and big data centers has risen sharply, driving higher demand for data transmission. 400G will be the general trend in the construction of a new generation of data centers and backbone networks. The 400G optical module is the core component of the 400Gbps system. Its main function is photoelectric conversion: the electrical signal is converted into an optical signal at the sending end, and then transmitted through the optical fiber, and the optical signal is converted into an electrical signal at the receiving end. The 400G optical module chip is the basis for forming the 400G optical module, and is the key commanding height of the 400Gbps system competition.
The frequency domain test of the optical module chip is a key test step to measure and evaluate the frequency domain bandwidth, 3dB cutoff frequency, reflection, differential parameters, group delay, second-order intermodulation, third-order intermodulation and other characteristics of the optical module chip. It is a necessary process in the process flow such as wafer testing and device packaging testing. The 400G optical module chip frequency domain test solution ZNA-GOCA jointly developed and launched by Rohde & Schwarz and Newkey Photonics combines Rohde & Schwarz’s vector network analyzer ZNA67 It integrates hardware and software with the optoelectronic base GOCA67 of 614 Technology to form a set of accurate, stable and efficient frequency domain test solutions for optical module chips.
A number of leading enterprise users in the optical communication industry have chosen the ZNA-GOCA solution developed by Rohde & Schwarz and 614 Technology for their 400G optical module chip R&D test and production test line frequency domain test solution. At the same time, the 110GHz frequency domain and test solution for the future 800Gbps optical communication system have also been verified by users.
ZNA-GOCA Optical Module Chip Frequency Domain Test Solution
The ZNA-GOCA optical module chip frequency domain test scheme adopts “microwave photonic technology”, which breaks through the limitations of traditional methods on measurement resolution and phase accuracy, and realizes the mapping of microwave spectrum scanning to light wave spectrum scanning. Electrical and optical-optical calibration technology to achieve large-bandwidth, high-precision, high-resolution component spectral response testing. Significant improvements have been achieved in key parameters such as frequency resolution, amplitude resolution, phase accuracy and dynamic range.
GOCAS optical module chip frequency domain test software interface
The test objects of the ZNA-GOCA optical module chip frequency domain test include: (1) Electro-optical devices. Such as intensity modulators (Mach-Zehnder modulators), amplitude modulators, electro-absorption modulators, directly modulated lasers, optical emission modules or links, etc.; (2) optoelectronic devices. Such as PIN photodiode, avalanche photodiode (APD), single-row carrier photodiode (UTC PD), light receiving module or link, etc.; (3) Optical and optical devices. Such as optical fibers, fiber gratings, optical integrated microrings/disks/spheres, highly nonlinear optical fibers, tunable optical delay lines, tunable optical filters, microwave photonic links, etc. Measurable parameters include: S-parameters, 3dB cutoff frequency, group delay, differential and common mode parameters, etc.
Typical test results are as follows:
I. Opto-electrical device (DUT: 50GHz high-speed photodetector)
Ⅱ. Electro-optical device (DUT: 50Gbps high-speed electro-optical modulator)
Ⅲ. Optical-optical device measurement (DUT: optical micro-ring chip)
The demand for data traffic in systems such as 5G communication and big data centers has risen sharply, driving higher demand for data transmission. 400G will be the general trend in the construction of a new generation of data centers and backbone networks. The 400G optical module is the core component of the 400Gbps system. Its main function is photoelectric conversion: the electrical signal is converted into an optical signal at the sending end, and then transmitted through the optical fiber, and the optical signal is converted into an electrical signal at the receiving end. The 400G optical module chip is the basis for forming the 400G optical module, and is the key commanding height of the 400Gbps system competition.
The frequency domain test of the optical module chip is a key test step to measure and evaluate the frequency domain bandwidth, 3dB cutoff frequency, reflection, differential parameters, group delay, second-order intermodulation, third-order intermodulation and other characteristics of the optical module chip. It is a necessary process in the process flow such as wafer testing and device packaging testing. The 400G optical module chip frequency domain test solution ZNA-GOCA jointly developed and launched by Rohde & Schwarz and Newkey Photonics combines Rohde & Schwarz’s vector network analyzer ZNA67 It integrates hardware and software with the optoelectronic base GOCA67 of 614 Technology to form a set of accurate, stable and efficient frequency domain test solutions for optical module chips.
A number of leading enterprise users in the optical communication industry have chosen the ZNA-GOCA solution developed by Rohde & Schwarz and 614 Technology for their 400G optical module chip R&D test and production test line frequency domain test solution. At the same time, the 110GHz frequency domain and test solution for the future 800Gbps optical communication system have also been verified by users.
ZNA-GOCA Optical Module Chip Frequency Domain Test Solution
The ZNA-GOCA optical module chip frequency domain test scheme adopts “microwave photonic technology”, which breaks through the limitations of traditional methods on measurement resolution and phase accuracy, and realizes the mapping of microwave spectrum scanning to light wave spectrum scanning. Electrical and optical-optical calibration technology to achieve large-bandwidth, high-precision, high-resolution component spectral response testing. Significant improvements have been achieved in key parameters such as frequency resolution, amplitude resolution, phase accuracy and dynamic range.
GOCAS optical module chip frequency domain test software interface
The test objects of the ZNA-GOCA optical module chip frequency domain test include: (1) Electro-optical devices. Such as intensity modulators (Mach-Zehnder modulators), amplitude modulators, electro-absorption modulators, directly modulated lasers, optical emission modules or links, etc.; (2) optoelectronic devices. Such as PIN photodiode, avalanche photodiode (APD), single-row carrier photodiode (UTC PD), light receiving module or link, etc.; (3) Optical and optical devices. Such as optical fibers, fiber gratings, optical integrated microrings/disks/spheres, highly nonlinear optical fibers, tunable optical delay lines, tunable optical filters, microwave photonic links, etc. Measurable parameters include: S-parameters, 3dB cutoff frequency, group delay, differential and common mode parameters, etc.
Typical test results are as follows:
I. Opto-electrical device (DUT: 50GHz high-speed photodetector)
Ⅱ. Electro-optical device (DUT: 50Gbps high-speed electro-optical modulator)
Ⅲ. Optical-optical device measurement (DUT: optical micro-ring chip)
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